Mass Spectrometry Services
Document Actions
|
|
With the development of multiple modes of sample introduction and
ionization almost any type of material can be analyzed by mass
spectometry (MS). These can range from simple monoatomic and
diatomic gases to complex high molecular weight polymers and
biomolecules. Mass spectrometry has become the method of choice
for the characterization of drugs, identification of chemical compounds
and even the sequencing of polypeptides. The MS facility has grown and evolved to a highly advanced and versatile service center. New instruments have expanded the range of services that can be performed in order to include volatile materials. These additional capabilities have led to a higher demand for analyses, a direct measure of the broader user community that can be served. The facility is under direct supervision of Dr. Osvaldo Rosario, who has twenty years of experience in mass spectrometry. Currently there are two Instrument Specialists provides service in this facility. The facility has the capability for running a broad range of applications, including GC / MS in capillary and packed column modes, HPLC / MS for both normal ans reverse phase, analysis of solids by Direct Insertion Probe (DIP) and Fast Atom Bombardment (FAB). Variable voltage electron impact and chemical ionization capabilities are available. High resolution spectra in the positive or negative ion modes for the determination of the unique chemical formulas for fragments and / or compunds and the low concentrations at which it can do this, the MS facility is one of the most used at the Materials Characterization Center. The Mass Spectrometry Facility has four instruments. These and their capabilites include: a VG-Fisons Autospec High Resolution MS System with GC / MC, DIP, FAB, LSIMS, EI and CI modes; a VG-Fisions Quatro MS / MS system with GC / MS, HPLC / MS, Ei and CI modes, APCI and direct sample introduction options; a Hewlett Packard 5995A with GC / MS (capillary and package columns), DIP, thermal and packed columns), DIP thermal disorption sample introduction; and two Hewlett Packard MSD GC / MS system. |
Last modified
2005-09-20 18:14
TGA resource
