Surface Analysis Services
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- Auger Electron Spectrometry (AES)
○ Standard AES analysis using a PHI Perkin Elmer 660 scanning Auger microprobe.
○ Depth Profile with ZalarTM rotation.
- Electron Spectroscopy for Chemical Analysis (ESCA or XPS)
○ Standard survey analysis using a PHI
Perkin Elmer or Highenergy resolution sooectron 5600ci ESCA.
○ Depth profile.
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Static Secondary Ion Mass Spectrometry Analysis (Static SIMS)
○ Standard ISS Analysis.
- Ion Scattering Spectroscopy (ISS)
○ Standard SIMS Analysis.
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Scanning Probe Microscope (AFM)
○ Using a Digital Instrument Nanoscope IIIa.
- Scanning Electron Microscope (SEM)
○ Conventional SEM using a JEOL 5800-LV.
○ Secondary electron imaging (SEI).
○ Backscaharn electron imaging (BEI) with low vacuum imaging capabilities.
- Energy Dispersive X-Ray Spectrometry (EDS)
○ Conventional SEM using a JEOL 5800-LV combined with a EDAX X-Ray Fluorescence CDU Leap Detection
- Fourier transform Infrared Microscopy (FT-IR Microscopy)
○ Using a Magna IR Nicolette 750 FT-IR spectrometer and a Nic Plan Microscope.
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Last modified
2005-11-07 15:00
TGA resource
