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  • Power Diffraction (Siemmens D5000)
     ○ Standard power x-ray diffraction in variable temperature stage (450   C<T<30 C).
     ○ X-Ray refelctometry for multilayer structure analysis.

  • Crystallography and Texture Determination (Siemmens GADDS System)
     ○ Texture analysis including pole figure generation.




Last modified 2005-07-15 17:58
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