Some typical applications regularly requested by our industrial/academia clients include:

  • Identification of Foreign matter
  • Characterization of the surface of materials
  • Characterization of raw materials (API)
  • Soil studies
  • Elemental analysis
  • Determination of phase diagrams, heat change  measurements and decomposition
  • Materials characterization through analysis of characteristic decomposition patterns
  • Studies of degradation mechanisms and reaction kinetics
  • Determination of organic content in a sample
  • Magnetic measurement of materials
  • Optical and photovoltaic studies

Instrumentation available:

  • Rigaku ZSX Primus II X-Ray Fluorescence (XRF)
  • Differential Thermal Analyzer (DTA-50)
  • Thermogravimetric Analyzer (TGA-50)
  • Differential Scanning Calorimeter (DSC-50)
  • Microtrac Particle Size Analyzer
  • Nanoscope V  AFM System from Bruker Instruments
  • Laser Raman Horiba T64000 spectrometers
  • Physical Property Measurement System (PPMS)