Surface Microscopy and Spectroscopy (SMS) and Crystallography

Some typical applications regularly requested by our industrial/academia clients include:

  • Identification of Foreign matter
  • Particle size
  • Characterization of the surface of materials
  • Determination of the elemental composition
  • Mapping
  • Identification of polymorphism in pharmaceutical solids
  • Characterization of raw materials (API)
  • Phase identification
  • Percent Crystallinity
  • Impurity Detection
  • Polymorphs
  • Crystal structure

Instrumentation available:

Scanning Electron Microscope (SEM) / Energy Dispersive X-Ray Spectrometry (EDS)

  • Conventional SEM using a JEOL 6480-LV
  • Secondary electron imaging (SEI)
  • Backscatter electron imaging (BEI) with low vacuum imaging capabilities.
  • EDAX X-Ray Fluorescence CDU Leap Detection

Fourier Transform Infrared Microscopy (FT-IR Microscopy)

  • Bruker Tensor 27 with Attenuated Total Reflectance Spectroscopy
  • Bruker Lumos IR Microscope
  • Thermo Nicolet™ iS™50 FT-IR Spectrometer/Continuum IR Microscope
  • Thermo Scientific™ DXR Raman Imaging Microscope

Nikon E400POL

Polarized Light Microscopy (PLM)

Electron Spectroscopy for Chemical Analysis (ESCA) / Static Secondary Ion Mass Spectrometry Analysis (Static SIMS)

  • Standard survey analysis using a PHI Perkin Elmer or Highenergy resolution sooectron  5600ci ESCA
  • Depth profile
  • Standard ISS Analysis

Auger Electron Spectrometry (AES)

  • Standard AES analysis using a PHI Perkin Elmer 660 scanning Auger microprobe
  • Depth Profile with ZalarTM rotation

X-Ray Diffractometer (XRD)

  • Rigaku Smart Lab III